The J.A. Woollam Company has over 30 years of experience in spectroscopic ellipsometry. We offer a wide range of spectroscopic ellipsometers for non-destructive materials characterization including thin film thickness (single and multilayer), optical constants, composition, growth/etch rates, and more. We have instruments available for research and manufacturing metrology covering wavelengths in the ultraviolet, visible, near-infrared, mid-infrared, and even at THz frequencies. We pride ourselves on creating the most advanced, high-quality and reliable ellipsometers available and working with our customers to solve even the most difficult problems. We are your Ellipsometry Experts.