We have investigated the properties of chromium oxide thin films prepared by reactive magnetron sputtering. The films were characterised by Scanning electron microscopy (SEM), X-ray diffraction (XRD), and Raman spectroscopy. The surface energy of chromium oxide thin films was probed using the Derjaguin-Landau-Verwey-Overbeek (XDLVO) theory approach. The surface energy measurement was carried out with a goniometer. The optical properties of the film were measured using a spectrophotometer in the wavelength range of 300 – 800 nm to obtain the optical transmission in the visible. Ellipsometry was used to obtain the n and k components of the complex refractive index. The corrosion properties of the prepared films were measured by open circuit potential, Tafel plots and potentiodynamic polarisation in saline solution. This information is necessary to identify a processing window for application areas for chromium oxide thin films requiring optical transmission and resistance to environmental degradation.
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