1961 4th SVC Technical Conference Proceedings

Note: Number in brackets on the top line is the paper number for 1961.

Interferometric Measurements of Thin Film Thicknesses [1]
F.E. Mauck, Gaertner Scientific Corporation.....1

Thin Film Semiconductors [2]
J.W. Buttrey and E.H. Tompkins, Armour Research Foundation.....8

Use of Electron Beams in Vacuum Coating [3]
M.H. Hablanian, NRC Equipment Corporation.....22

A Vacion^® Pumped Automatic Vacuum Coating [4]
J.W. Ackley, W.A. Lloyd and R. Zaphiropoulos, Varian Associates.....34

Thick Films for Ruling Diffraction Gratings [5]
E. Leibhardt, Defraction Products, Inc......43

An Evaluation of Plastic Materials and Coating Requirements for Metallized Finishes in Automotive Applications [6]
G.M. Haviland, General Motors Corporation.....46

Automation on Second Surface Applications [7]
W.A. Czebatul, General Motors Corporation .....53

Problems of Metallizing Various Materials [8]
V.H. Rampelberg and J. Scharnberg, Bee Chemical Company.....56

Masks and Their Tolerances [9]
T.J. LaBounty, Midwest Technical Service.....63

Optics Research [10]
P.N. Slater, Armour Research Foundation.....69

Functional Vacuum Plating in Europe [11]
W.P. Strickland.....73